Back side Raman measurements on Ge/Pd/n‐GaAs ohmic contact structures
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.111582
Reference21 articles.
1. Van der Waals bonding of GaAs on Pd leads to a permanent, solid‐phase‐topotaxial, metallurgical bond
2. The effect of the planar doping on the electrical transport properties at the Al:n‐GaAs(100) interface: Ultrahigh effective doping
3. Insitucontacts to GaAs based on InAs
4. A study of Ge/GaAs interfaces grown by molecular beam epitaxy
5. Raman scattering study of alloyed Au‐Ge ohmic contacts to GaAs
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1. Silicon doping effects on optical properties of InAs ultrathin layer embedded in GaAs/AlGaAs:δSi high electron mobility transistors structures;Superlattices and Microstructures;2011-05
2. Improvement of Ge/Pd/GaAs ohmic contact by In layer;Journal of Materials Science: Materials in Electronics;2007-02-21
3. Raman spectroscopy of Ge/Pd/GaAs contacts;Microelectronic Engineering;2004-02
4. Raman scattering characterization of Si-doped Ga0.52In0.48P grown by solid source molecular beam epitaxy;Materials Science and Engineering: B;2000-07
5. Transmission electron microscopy study of rapid thermally annealed Pd/Ge contacts on In0.53Ga0.47As;Journal of Applied Physics;1996-10
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