Author:
Jeong Doo Seok,Park Hong Bae,Hwang Cheol Seong
Subject
Physics and Astronomy (miscellaneous)
Reference11 articles.
1. Suppressed shot noise in trap-assisted tunneling of metal–oxide–semiconductor capacitors
2. Polarity effect on the temperature dependence of leakage current through HfO2/SiO2 gate dielectric stacks
3. P. Hesto , inInstabilities in Silicon Devices, edited by G. Barbottin and A. Vapaille (North-Holland, Amsterdam, 1986), p. 303.
4. N.F. Mott, and R.W. Gurney ,Electronic Processes in Ionic Crystals, 2nd ed. (Clarendon, Oxford, 1940), p. 85.
5. On Pre-Breakdown Phenomena in Insulators and Electronic Semi-Conductors
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