Valence-band electronic structure of silicon nitride studied with the use of soft-x-ray emission
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.33.2432/fulltext
Reference24 articles.
1. Hole conduction and valence‐band structure of Si3N4 films on Si
2. The electronic structure of silicon nitride
3. The electronic properties of silicon nitride
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