First-principles study of native point defects in hafnia and zirconia-Reference-Cited by-同舟云学术

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First-principles study of native point defects in hafnia and zirconia

Published:2007-03-14 Issue:10 Volume:75 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Zheng J. X.,Ceder G.,Maxisch T.,Chim W. K.,Choi W. K.

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.75.104112/fulltext

Reference62 articles.

1. Thermochemical Data of Pure Substances

2. High-? Gate Dielectrics

3. Structure and stability of ultrathin zirconium oxide layers on Si(001)

4. Thermal stability of ultrathin ZrO2 films prepared by chemical vapor deposition on Si(100)

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