Structure and stability of ultrathin zirconium oxide layers on Si(001)
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.125779
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1. Tantalum pentoxide (Ta2O5) thin films for advanced dielectric applications
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5. Leakage current and electrical breakdown in metal‐organic chemical vapor deposited TiO2 dielectrics on silicon substrates
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