Pure edge-dislocation half-loops in low-temperature <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:mrow><mml:mi>Ga</mml:mi><mml:mi mathvariant="normal">N</mml:mi></mml:mrow></mml:math> for V-defect formation-Reference-Cited by-同舟云学术

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Pure edge-dislocation half-loops in low-temperature GaN for V-defect formation

Published:2024-06-17 Issue:6 Volume:21 Page:
ISSN:2331-7019
Container-title:Physical Review Applied
language:en
Short-container-title:Phys. Rev. Applied

Author:

Ewing Jacob J.¹,Wu Feng¹,Quevedo Alejandro¹^ORCID,Tak Tanay¹^ORCID,Nakamura Shuji¹¹,DenBaars Steven P.¹¹^ORCID,Speck James S.¹^ORCID

Affiliation:

1. University of California, Santa Barbara

Funder

Department of Energy

EERE

Solid-State Lighting and Energy Electronics Center

National Science Foundation

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevApplied.21.064042/fulltext

Reference45 articles.

1. Barriers to carrier transport in multiple quantum well nitride-based c -plane green light emitting diodes

2. Improved Vertical Carrier Transport for Green III-Nitride LEDs Using (In,Ga)N Alloy Quantum Barriers

3. A 3D simulation comparison of carrier transport in green and blue c-plane multi-quantum well nitride light emitting diodes

4. Roles of V-shaped pits on the improvement of quantum efficiency in InGaN/GaN multiple quantum well light-emitting diodes

5. Hole injection from the sidewall of V-shaped pits into c-plane multiple quantum wells in InGaN light emitting diodes

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Properties of V-defect injectors in long wavelength GaN LEDs studied by near-field electro- and photoluminescence;Journal of Applied Physics;2024-08-26

2. Advances in InGaN-based RGB micro-light-emitting diodes for AR applications: Status and perspective;APL Materials;2024-08-01

3. Dislocation half-loop control for optimal V-defect density in GaN-based light emitting diodes;Applied Physics Letters;2024-07-22

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