Si(111)7×7 and Si(111)√3¯×√3¯-al surface-structure analysis by ion-induced Auger-electron spectroscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.36.9107/fulltext
Reference28 articles.
1. Surface analysis using proton beams
2. Surface analysis by spectroscopy of Auger electrons induced by surface channeled ions
3. Auger electron yields induced by channeled ions at grazing incidence
4. Surface stacking sequence and (7 × 7) reconstruction at Si(111) surfaces
5. Structural models for Si(111)‐(7×7)
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1. Ultrathin Al layers on Si(111) and Si(100): structures and phase transitions;Surface and Interface Analysis;2001-08
2. Adsorption and growth of Al on Si(100) in the initial stage;Applied Physics A: Materials Science & Processing;1999-02-01
3. Study of the Si(111)7 × 7 surface by RHEED rocking curve analysis;Surface Science;1994-06
4. Effect of NH3 adsorption on the atomic structure of Si(111) √3 × √3 - Al and Si(111) √3 × √3 - Ag surfaces;Surface Science;1993-10
5. American society for testing and materials. Standard guide for depth profiling in auger electron spectroscopy (E1127-91);Surface and Interface Analysis;1991-12
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