Surface analysis using proton beams
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference30 articles.
1. Studies in X-Ray Production by Proton Bombardment of C, Mg, Al, Nd, Sm, Gd, Tb, Dy, and Ho
2. Proposed Method for Microgram Surface Density Measurements by Observation of Proton‐Produced X Rays
3. Measurement of Microgram Surface Densities by Observation of Proton Produced X Rays
4. Oxygen Surface‐Density Measurements Based on Characteristic X‐Ray Production by 100‐keV Protons
Cited by 34 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Ion-induced Auger emission from Si, Al and AlxMg1−x samples;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1991-06
2. Si(111)7×7 and Si(111)√3¯×√3¯-al surface-structure analysis by ion-induced Auger-electron spectroscopy;Physical Review B;1987-12-15
3. Considerations for application of Si(Li) detectors in analysis of sub-keV, ion-induced X-rays;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1986-04
4. The effect of channeling on MeV ion-induced auger electron production in silicon;Surface Science;1985-07
5. The effect of channeling on MeV ion-induced auger electron production in silicon;Surface Science Letters;1985-07
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