Considerations for application of Si(Li) detectors in analysis of sub-keV, ion-induced X-rays-Reference-Cited by-同舟云学术

Considerations for application of Si(Li) detectors in analysis of sub-keV, ion-induced X-rays

Published:1986-04 Issue:1-6 Volume:15 Page:735-739
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Musket R.G.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference23 articles.

5. New Uses of Ion Accelerators;Cairns,1975

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3. Realization of the simultaneous micro-PIXE analysis of heavy and light elements at a nuclear microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-07

5. Dual detector system for PIXE measurement covering a wide element range;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04