Measurement of Microgram Surface Densities by Observation of Proton Produced X Rays
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1720519
Reference5 articles.
1. Proposed Method for Microgram Surface Density Measurements by Observation of Proton‐Produced X Rays
2. CharacteristicK-Shell X-Ray Production in Magnesium, Aluminum, and Copper by 60- to 500-ke V Protons
3. Studies in X-Ray Production by Proton Bombardment of C, Mg, Al, Nd, Sm, Gd, Tb, Dy, and Ho
4. Passage of Heavy Particles through Matter
5. SOME LOW-ENERGY ATOMIC STOPPING CROSS SECTIONS
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1. Comparison of the probability density functions for the ranges of electrons, positrons and protons;Journal of Analytical Atomic Spectrometry;1999
2. A uniform Laplacian procedure for X-ray fluorescence analysis, electron microprobe and particle-induced X-ray emission;Spectrochimica Acta Part B: Atomic Spectroscopy;1992-07
3. Uses of PIXE at low proton energies;Applied Surface Science;1990-09
4. The role of the ionization and stopping cross sections in PIXE thin film thickness measurements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-09
5. M-shell x-ray production cross sections in thick targets of Ir, Pt, and Pb by 0.4–2.2-MeVHe+4ions;Physical Review A;1985-01-01
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