Auger electron yields induced by channeled ions at grazing incidence
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference50 articles.
1. Surface analysis using proton beams
2. Principles and applications of ion-induced auger electron emission from solids
3. Orientational effects in the ion-excited auger electron emission
4. The role of recoil atoms in ion excited Auger electron emission from single crystals
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1. PLVVandLMMAuger emission induced byAr+impact on the InP(110) surface;Physical Review B;1997-12-15
2. Auger electron and secondary electron yields induced by surface-channeled protons;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-03
3. Si L23VV auger electron emission induced by specularly reflected protons;Surface Science;1990-01
4. Surface analysis by spectroscopy of Auger electrons induced by fast protons at grazing incidence;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-01
5. Computer simulation of reflection of P ions from Si(100) crystalline targets in grazing incidence ion implantation;Journal of Applied Physics;1988-08-15
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