Surface analysis by spectroscopy of Auger electrons induced by fast protons at grazing incidence
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference36 articles.
1. Energy loss of MeV light ions specularly reflected from a SnTe(001) surface
2. Surface analysis of crystals by surface channeling
3. Specular reflection of fast ions at a single crystal surface
4. Surface analysis by spectroscopy of Auger electrons induced by surface channeled ions
5. Si(111)7×7 and Si(111)√3¯×√3¯-al surface-structure analysis by ion-induced Auger-electron spectroscopy
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1. Investigation of thermal vibration correlation of [110] silicon lattice atoms by ion scattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-05
2. Azimuthal effects in grazing surface scattering;Journal of Electron Spectroscopy and Related Phenomena;2003-06
3. Probing the growth, structure, and magnetism of epitaxial films by grazing scattering of fast ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-08
4. Effects of defect structures at surfaces and thin films on grazing scattering of fast ions;Physical Review B;1998-06-15
5. Reflection of energetic beams at glancing incidence from a crystal surface;Vacuum;1993-11
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