High-accuracy determination of trace elements by total reflection X-ray fluorescence spectrometry using freeze-dried specimens-Reference-Cited by-同舟云学术

High-accuracy determination of trace elements by total reflection X-ray fluorescence spectrometry using freeze-dried specimens

Published:2022 Issue:22 Volume:147 Page:5130-5137
ISSN:0003-2654
Container-title:The Analyst
language:en
Short-container-title:Analyst

Author:

Matsuyama Tsugufumi¹^ORCID,Tanaka Yudai¹,Nakae Masanori¹,Furusato Takumi¹,Tsuji Kouichi¹

Affiliation:

1. Division of Science and Engineering for Materials, Department of Chemistry and Bioengineering, Osaka Metropolitan University, Sugimoto 3-3-138, Sumiyoshi-ku, Osaka 558-8585, Japan

Abstract

To prepare the spread residue, the freeze-drying method is introduced to total reflection X-ray fluorescence (TXRF) analysis.

Funder

Japan Society for the Promotion of Science

Publisher

Royal Society of Chemistry (RSC)

Subject

Electrochemistry,Spectroscopy,Environmental Chemistry,Biochemistry,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2022/AN/D2AN01290A

Reference15 articles.

1. CXVII. The total reflexion of X-rays

2. Optical Flats for Use in X‐Ray Spectrochemical Microanalysis

3. Total reflection x-ray fluorescence analysis—a review

4. R.Kloclenkämper and A.von Bohlen , Instrumentation for TXRF and GIXRF , in total reflection X-ray fluorescence analysis and related methods , ed M. F. Vitha , Wiley , New York , 2015

5. Critical evaluation of the use of total reflection X-ray fluorescence spectrometry for the analysis of whole blood samples: application to patients with thyroid gland diseases

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