High-accuracy total reflection X-ray fluorescence analysis for determining trace elements using substrate cleaned by ammonia-hydrogen peroxide mixture
Author:
Funder
Japan Society for the Promotion of Science
Publisher
Elsevier BV
Subject
Analytical Chemistry
Reference22 articles.
1. Instrumentation for TXRF and GIXRF;Kloclenkämper,2015
2. Optical Flats for Use in X‐Ray Spectrochemical Microanalysis;Yoneda;Rev. Sci. Instrum.,1971
3. The total reflection of X-rays;Compton;Phil. Mag.,1923
4. Uranium determination in seawater by total reflection X-ray fluorescence spectrometry;Misra;Spectrochim. Acta B,2006
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