Optical Flats for Use in X‐Ray Spectrochemical Microanalysis-Reference-Cited by-同舟云学术

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Optical Flats for Use in X‐Ray Spectrochemical Microanalysis

Published:1971-07 Issue:7 Volume:42 Page:1069-1070
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Yoneda Y.,Horiuchi T.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1685282

Reference5 articles.

1. Trace Analysis by X-Ray Emission Spectrography

2. Chemical Analysis of Thin Films by X-Ray Emission Spectrography

3. Micro Fluorescent X-Ray Analyzer

4. Anomalous Surface Reflection of X Rays

5. Interpretation of the Anomalous Surface Reflection of X Rays

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