Total reflection x-ray fluorescence analysis—a review-Reference-Cited by-同舟云学术

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Total reflection x-ray fluorescence analysis—a review

Published:2007 Issue:5 Volume:36 Page:289-300
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Wobrauschek P.

Publisher

Wiley

Subject

Spectroscopy

Reference99 articles.

1. Optical Flats for Use in X‐Ray Spectrochemical Microanalysis

2. Total-reflection x-ray fluorescence spectrometric determination of elements in nanogram amounts

3. An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level

4. Total Reflection X-ray Fluorescence Analysis. John Wiley & Sons: Chicester, 1997.

5. Surface Studies of Solids by Total Reflection of X-Rays

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