1. Effects of crystallinity on depth resolution in sputter depth profiles
2. The depth dependence of the depth resolution in composition-depth profiling with Auger Electron Spectroscopy
3. Characterization of a high depth-resolution tantalum pentoxide sputter profiling reference material
4. S.
Hofmann
, Depth Profiling in AES and XPS, in Practical Surface Analysis 2nd Edn. Vol 1 – Auger and X-ray Photoelectron Spectroscopy, ed. D. Briggs and M. P. Seah, Wiley, Chichester, 1990, ch. 4, pp. 143–199
5. K.
Wittmaack
, Basic Aspects of Sputter Depth Profiling, in Practical Surface Analysis, 2nd Edn Vol 2 – Ion and Neutral Spectroscopy, ed. D. Briggs and M. P. Seah, Wiley, Chichester, 1992, ch. 3, pp. 105–175