Characterization of a high depth-resolution tantalum pentoxide sputter profiling reference material
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference67 articles.
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3. Surface and thin film analysis of semiconductor materials
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5. The use of X-ray photoelectron spectroscopy in corrosion science
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