A two‐point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects
Author:
Affiliation:
1. National Physical Laboratory Teddington UK
2. Kobelco Research Institute, Inc. Kobe Japan
3. Department of Medical Physics Vejle Hospital Vejle Denmark
4. Department of Materials and Life Science Seikei University Tokyo Japan
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.7042
Reference41 articles.
1. TOF-SIMS matrix effects in mixed organic layers in Ar cluster ion depth profiles
2. Reducing the Matrix Effect in Molecular Secondary Ion Mass Spectrometry by Laser Post-Ionization
3. SIMS of Delta Layers in Organic Materials: Amount of Substance, Secondary Ion Species, Matrix Effects, and Anomalous Structures in Argon Gas Cluster Depth Profiles
4. SIMS of organic layers with unknown matrix parameters: Locating the interface in dual beam argon gas cluster depth profiles
5. Quantifying SIMS of Organic Mixtures and Depth Profiles—Characterizing Matrix Effects of Fragment Ions
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