1. Honig, R. E. Sputtering of surfaces by positive ion beams of low energy. J. Appl. Phys. 29, 549–555 (1958).
2. Benninghoven, A., Rudenauer, F. G. & Werner, H. W. Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends (John Wiley & Sons, 1987).
3. ToF-SIMS: Materials Analysis by Mass Spectrometry (Surface Spectra Ltd and IM Publications LLP, 2013).
4. van der Heide, P. Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices (Wiley, 2014).
5. Stevie, F. A. Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization (Momentum Press, 2016).