SIMS of organic layers with unknown matrix parameters: Locating the interface in dual beam argon gas cluster depth profiles-Reference-Cited by-同舟云学术

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SIMS of organic layers with unknown matrix parameters: Locating the interface in dual beam argon gas cluster depth profiles

Published:2019-09-02 Issue:13 Volume:51 Page:1332-1341
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Havelund Rasmus¹^ORCID,Seah Martin P.¹^ORCID,Gilmore Ian S.¹^ORCID

Affiliation:

1. National Physical Laboratory Teddington UK

Funder

Department for Business, Energy and Industrial Strategy

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.6701

Reference24 articles.

1. An analytic form for the SIMS response function measured from ultra-thin impurity layers

2. Secondary ion mass spectrometry analysis of ultrathin impurity layers in semiconductors and their use in quantification, instrumental assessment, and fundamental measurements

3. Characterization of sharp interfaces and delta doped layers in semiconductors using secondary ion mass spectrometry

4. Dopant spatial distributions: Sample-independent response function and maximum-entropy reconstruction

5. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

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1. Quantitative and Qualitative Analyses of Mass Spectra of OEL Materials by Artificial Neural Network and Interface Evaluation: Results from a VAMAS Interlaboratory Study;Analytical Chemistry;2023-09-16

2. A two‐point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects;Surface and Interface Analysis;2021-11-16

3. Characterization of polymeric surfaces and interfaces using time‐of‐flight secondary ion mass spectrometry;Journal of Polymer Science;2021-08-28

4. Atomic spectrometry update: review of advances in the analysis of metals, chemicals and materials;Journal of Analytical Atomic Spectrometry;2020

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