Author:
Dowsett M. G.,Rowlands G.,Allen P. N.,Barlow R. D.
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference27 articles.
1. SIMS profile simulation using delta function distributions
2. Practical Surface Analysis, Vol. 2, ed. by and Chapt. 3. Wiley, Chichester (1992).
3. and Practical Surface Analysis, Vol. 2, ed. by and Chapt. 5. Wiley, Chichester (1992).
4. Secondary ion mass spectrometry depth profiling of boron, antimony, and germanium deltas in silicon and implications for profile deconvolution
5. and Secondary Ion Mass Spectrometry SIMS VIII, ed. by and p. 111. Wiley, Chichester (1992).
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