Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference16 articles.
1. and (eds), Secondary Ion Mass Spectrometry, Appendix B pp. 1121-1124. Wiley, Chichester (1987).
2. A high-resolution multiple-crystal multiple-reflection diffractometer
3. Composition studies of MBE GaInP alloys by Rutherford scattering and x‐ray diffraction
4. Practical surface analysis: state of the art and recent developments in AES, XPS, ISS and SIMS
5. and Proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Monterey, CA, USA, 1989, ed. by and pp. 99-102. Wiley, Chichester (1990).
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