Characterization of polymeric surfaces and interfaces using time‐of‐flight secondary ion mass spectrometry-Reference-Cited by-同舟云学术

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Characterization of polymeric surfaces and interfaces using time‐of‐flight secondary ion mass spectrometry

Published:2021-08-28 Issue: Volume: Page:
ISSN:2642-4150
Container-title:Journal of Polymer Science
language:en
Short-container-title:Journal of Polymer Science

Author:

Mei Hao¹,Laws Travis S.²,Terlier Tanguy³^ORCID,Verduzco Rafael¹³⁴^ORCID,Stein Gila E.²^ORCID

Affiliation:

1. Department of Chemical and Biomolecular Engineering Rice University Houston Texas USA

2. Department of Chemical and Biomolecular Engineering University of Tennessee Knoxville Tennessee USA

3. Shared Equipment Authority Rice University Houston Texas USA

4. Materials Science and NanoEngineering Rice University Houston Texas USA

Funder

University of Tennessee

Publisher

Wiley

Subject

Materials Chemistry,Polymers and Plastics,Physical and Theoretical Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pol.20210282

Reference167 articles.

1. Latest applications of 3D ToF-SIMS bio-imaging

2. TOF-SIMS characterization of industrial materials: from silicon wafer to polymer

3. Recent advances in secondary ion mass spectrometry of solid acid catalysts: large zeolite crystals under bombardment

4. Using ToF-SIMS to study industrial surface phenomena

5. Quantitative Surface Analysis of Ethylene-Propylene Polymers using ToF-SIMS

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