Band-to-Band Tunneling Leakage Current Characterization and Projection in Carbon Nanotube Transistors-Reference-Cited by-同舟云学术

Band-to-Band Tunneling Leakage Current Characterization and Projection in Carbon Nanotube Transistors

Published:2023-11-01 Issue:21 Volume:17 Page:21083-21092
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Lin Qing¹^ORCID,Gilardi Carlo¹,Su Sheng-Kai²,Zhang Zichen³^ORCID,Chen Edward²,Bandaru Prabhakar³^ORCID,Kummel Andrew³^ORCID,Radu Iuliana²,Mitra Subhasish¹,Pitner Greg⁴,Wong H.-S. Philip¹

Affiliation:

1. Dept. of Electrical Engineering, Stanford University, Stanford, California 94305, United States

2. Corporate Research, Taiwan Semiconductor Manufacturing Company, Hsinchu 30075, Taiwan

3. Dept. of Electrical Engineering, University of California San Diego, San Diego, California 92093, United States

4. Corporate Research, Taiwan Semiconductor Manufacturing Company, San Jose, California 95134, United States

Funder

Defense Sciences Office, DARPA

Division of Electrical, Communications and Cyber Systems

Stanford SystemX Alliance

Taiwan Semiconductor Manufacturing Company

Eccalon LLC

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.3c04346

Reference46 articles.

1. Ballistic carbon nanotube field-effect transistors

2. Scaling carbon nanotube complementary transistors to 5-nm gate lengths

3. Sub-10 nm Carbon Nanotube Transistor

4. Carbon nanotube transistors scaled to a 40-nanometer footprint

5. Perspective on Low-dimensional Channel Materials for Extremely Scaled CMOS

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nonideality in Arrayed Carbon Nanotube Field Effect Transistors Revealed by High-Resolution Transmission Electron Microscopy;ACS Nano;2024-08-07

2. Future Design Direction for SRAM Data Array: Hierarchical Subarray With Active Interconnect;IEEE Transactions on Circuits and Systems I: Regular Papers;2024