Interfacial Reactions between Ga and Cu-10Ni Substrate at Low Temperature

Author:

Liu Shiqian1ORCID,Zeng Guang2ORCID,Yang Wenhui3,McDonald Stuart1,Gu Qinfen4ORCID,Matsumura Syo5,Nogita Kazuhiro1

Affiliation:

1. Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland, Brisbane, Queensland 4072, Australia

2. School of Materials Science and Engineering, Central South University, Changsha 410083, China

3. Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Motooka 744, Nishi-ku, Fukuoka 819-0395, Japan

4. Powder Diffraction Beamline, The Australian Synchrotron (ANSTO), Clayton, Victoria 3168, Australia

5. The Ultramicroscopy Research Center, Kyushu University, Motooka 744, Nishi-ku, Fukuoka 819-0395, Japan

Funder

Kyushu University

Department of Education and Training

University of Queensland

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Reference51 articles.

1. Low temperature bonding technology for 3D integration

2. Kim, Y. I.; Yang, K. H.; Lee, W. S. Thermal Degradation of DRAM Retention Time: Characterization and Improving Techniques. In 2004 IEEE International Reliability Physics Symposium. Proceedings; 2004; pp 667–668.

3. Materials, processing and reliability of low temperature bonding in 3D chip stacking

4. The Elements

5. Eutectic Gallium-Indium (EGaIn): A Liquid Metal Alloy for the Formation of Stable Structures in Microchannels at Room Temperature

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