In Situ Observation of the Ga- and Cu-Based Substrate Reaction by Synchrotron Microradiography-Reference-Cited by-同舟云学术

In Situ Observation of the Ga- and Cu-Based Substrate Reaction by Synchrotron Microradiography

Published:2023-12-11 Issue:12 Volume:5 Page:7004-7014
ISSN:2637-6113
Container-title:ACS Applied Electronic Materials
language:en
Short-container-title:ACS Appl. Electron. Mater.

Author:

Hao Qichao¹^ORCID,Tan Xin Fu¹^ORCID,Liu Shiqian¹²^ORCID,McDonald Stuart D.¹,Yasuda Hideyuki³,Nogita Kazuhiro¹

Affiliation:

1. Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland, St. Lucia, QLD 4072, Australia

2. Graduate School, Shenzhen Technology University, Shenzhen, Guangdong 515118, China

3. Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan

Funder

Australian Research Council

Nihon Superior

Research Computing Centre, University of Queensland

Japan Society for the Promotion of Science

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaelm.3c01383

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5. Applications of Artificial Intelligence in Transport: An Overview