Cluster Secondary Ion Mass Spectrometry and the Temperature Dependence of Molecular Depth Profiles
Author:
Affiliation:
1. The Pennsylvania State University, Department of Chemistry, University Park, Pennsylvania 16802, United States
2. Faculty of Physics, University of Duisburg-Essen, 47048 Duisburg, Germany
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac2032589
Reference41 articles.
1. Depth profiling of polycrystalline multilayers using aBuckminsterfullerene projectile
2. Molecular Depth Profiling of Multilayer Polymer Films Using Time-of-Flight Secondary Ion Mass Spectrometry
3. Quantitative Molecular Depth Profiling of Organic Delta-Layers by C60 Ion Sputtering and SIMS
4. Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 1. Investigation of Depth Profile Characteristics
5. Depth Resolution During C60+ Profiling of Multilayer Molecular Films
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