The matrix effect in organic secondary ion mass spectrometry-Reference-Cited by-同舟云学术

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The matrix effect in organic secondary ion mass spectrometry

Published:2015-02 Issue: Volume:377 Page:599-609
ISSN:1387-3806
Container-title:International Journal of Mass Spectrometry
language:en
Short-container-title:International Journal of Mass Spectrometry

Author:

Shard Alexander G.,Spencer Steve J.,Smith Steve A.,Havelund Rasmus,Gilmore Ian S.

Funder

EMRP

European Union

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation

Reference39 articles.

1. An empirical model for ion formation from polymer surfaces during analysis by secondary ion mass spectrometry

2. Matrix effects, internal energies and MS/MS spectra of molecular ions sputtered from surfaces

3. Suppression and enhancement of secondary ion formation due to the chemical environment in static-secondary ion mass spectrometry

4. Organic Depth Profiling of a Binary System: the Compositional Effect on Secondary Ion Yield and a Model for Charge Transfer during Secondary Ion Emission

5. Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

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