Suppression and enhancement of secondary ion formation due to the chemical environment in static-secondary ion mass spectrometry-Reference-Cited by-同舟云学术

Suppression and enhancement of secondary ion formation due to the chemical environment in static-secondary ion mass spectrometry

Published:2007-08-01 Issue:8 Volume:18 Page:1559-1567
ISSN:1044-0305
Container-title:Journal of the American Society for Mass Spectrometry
language:en
Short-container-title:J. Am. Soc. Mass Spectrom.

Author:

Jones Emrys A.¹,Lockyer Nicholas P.¹,Kordys Jeanette¹,Vickerman John C.¹

Affiliation:

1. Surface Analysis Research Centre, Manchester Interdisciplinary Biocentre, CEAS, University of Manchester, 131 Princess St., M1 7DN, Manchester, U.K.

Publisher

American Chemical Society (ACS)

Subject

Spectroscopy,Structural Biology

Link

https://pubs.acs.org/doi/pdf/10.1016/j.jasms.2007.05.014

Reference43 articles.

1. Static time-of-flight secondary ion mass spectrometry imaging of freeze-fractured, frozen-hydrated biological membranes

2. Peer Reviewed: Organic SIMS of Biologic Tissue

3. Development and experimental application of a gold liquid metal ion source

4. Cluster primary ion bombardment of organic materials

5. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics

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