Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study-Reference-Cited by-同舟云学术

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Published:2012-09-05 Issue:18 Volume:84 Page:7865-7873
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Shard Alexander G.¹,Havelund Rasmus¹,Seah Martin P.¹,Spencer Steve J.¹,Gilmore Ian S.¹,Winograd Nicholas²,Mao Dan²,Miyayama Takuya³,Niehuis Ewald⁴,Rading Derk⁴,Moellers Rudolf⁴

Affiliation:

1. National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom

2. Department of Chemistry, Pennsylvania State University, 104 Chemistry Building, University Park, Pennsylvania 16802, United States

3. ULVAC-PHI, Inc., 370 Enzo, Chigasaki, 253-8522, Japan

4. ION-TOF GmbH, Heisenbergstr. 15, D-48149 Muenster, Germany

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac301567t

Reference42 articles.

1. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

2. Three-Dimensional Compositional Analysis of Drug Eluting Stent Coatings Using Cluster Secondary Ion Mass Spectrometry

3. Molecular depth profiling of organic and biological materials

4. Characterization of drug-eluting stent (DES) materials with cluster secondary ion mass spectrometry (SIMS)

5. Dynamic SIMS utilizing SF5+ polyatomic primary ion beams for drug delivery applications

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