Quantitative Molecular Depth Profiling of Organic Delta-Layers by C60 Ion Sputtering and SIMS
Author:
Affiliation:
1. National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/jp077325n
Reference35 articles.
1. Depth Profiling of Langmuir−Blodgett Films with a Buckminsterfullerene Probe
2. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry
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