Author:
Masri P.,Moreaud N.,Averous M.,Stauden Th.,Wohner T.,Pezoldt J.
Abstract
ABSTRACT3C-SiC/Si structures with Ge incorporation are elaborated by solid source molecular beam epitaxy (SSMBE). A comparison of the flatness of the SiC-surface and the interface between SiC and Si by comparing the deposition with and without Ge is made. The results are analyzed within the framework of a theoretical approach based on the theory of elasticity.
Publisher
Springer Science and Business Media LLC
Cited by
9 articles.
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