Simulation Study of Low Turn-Off Loss and Snapback-Free SA-IGBT with Injection-Enhanced p-Floating Layer

Abstract

In this study, a shorted-anode IGBT with an injection-enhanced p-floating layer (IEPF-IGBT) under the N-buffer layer is proposed. Compared to conventional shorted-anode IGBT (SA-IGBT), the IEPF-IGBT has the structural characteristics of an injection-enhanced P-floating (IEPF) layer inserted into the N-buffer layer and the P+ collector region. The IEPF layer and P+ collector region pinch off the electron path during the turn-on period to suppress the snapback effect with a half-cell pitch of 10 μm. In addition, the IEPF layer acts as an injection-enhanced layer that influences the current injection of the holes. There is 56.3% reduction in the turn-off loss of the IEPF-IGBT at the same forward voltage drop.