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Exploring neutral atom microscopy

Published:2014-06-20 Issue:9 Volume:49 Page:690-698
ISSN:0232-1300
Container-title:Crystal Research and Technology
language:en
Short-container-title:Crystal Research and Technology

Author:

Witham P.¹,Sánchez E.¹

Affiliation:

1. Portland State University; Dept. of Physics; PO Box 751 Portland Oregon 97207-0751 USA

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/crat.201300401/fullpdf

Reference13 articles.

1. Probing Surfaces with Thermal He Atoms: Scattering and Microscopy with a Soft Touch

2. Ultra low-k shrinkage behavior when under electron beam in a scanning electron microscope;Lorut;J. Appl. Phys.,2013

3. Imaging with neutral atoms: a new matter wave microscope;Koch;J. Microsc.,2008

4. A simple approach to neutral atom microscopy;Witham;Rev. Sci. Instrum.,2011

5. Increased resolution in neutral atom microscopy;Witham;J. Microsc,2012

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1. Measuring scattering distributions in scanning helium microscopy;Ultramicroscopy;2024-06

2. Diffractive mirrors for neutral-atom matter-wave optics;Faraday Discussions;2024

3. Neutral helium atom microscopy;Ultramicroscopy;2023-09

4. Contrast inversion in neutral-atom microscopy using atomic cluster beams;Physical Review A;2023-06-14

5. Standardizing resolution definition in scanning helium microscopy;Ultramicroscopy;2022-03

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