Measuring scattering distributions in scanning helium microscopy-Reference-Cited by-同舟云学术

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Measuring scattering distributions in scanning helium microscopy

Published:2024-06 Issue: Volume:260 Page:113951
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Hatchwell C.J.^ORCID,Bergin M.,Carr B.,Barr M.G.,Fahy A.,Dastoor P.C.

Publisher

Elsevier BV

Reference44 articles.

1. Imaging with neutral atoms—a new matter-wave microscope;Koch;J. Microsc.,2008

2. A design for a pinhole scanning helium microscope;Barr;Nucl. Instrum. Methods Phys. Res. B,2014

3. Neutral helium atom microscopy;Palau;Ultramicroscopy,2023

4. A simple approach to neutral atom microscopy;Witham;Rev. Sci. Instrum.,2011

5. Image formation in the scanning helium microscope;Fahy;Ultramicroscopy,2018

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 3D surface profilometry using neutral helium atoms;Applied Physics Letters;2024-05-13

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