Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference44 articles.
1. [Vision: Human] and Electronic, Optical Physics and Engineering;Rose,1973
2. Summary of iso/tc 201 technical report: iso/tr 19319, 2013 – surface chemical analysis – fundamental approaches to determination of lateral resolution and sharpness in beam-based methods;Senoner;Surface and Interface Analysis,2013
3. W.E.S. Unger, M. Senoner, J.M. Stockmann, V. Fernandez, N. Fairley, C. Passiu, N.D. Spencer, A. Rossi, Summary of ISO/TC 201 International Standard ISO 18516, 2019 Surface chemical analysis—Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X-ray photoelectron spectrometers (XPS), Surf. Interf. Anal. http://dx.doi.org/10.1002/sia.7025, N/A (N/A) _eprint: (Accessed October 2021).
4. Imaging surface analysis: Lateral resolution and its relation to contrast and noise;Senoner;J. Anal. At. Spectrom.,2010
5. XXXI. investigations in optics with special reference to the spectroscope;Rayleigh;Lond. Edinburgh Dublin Philosoph. Mag. J. Sci.,1879
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