Increased resolution in neutral atom microscopy

Author:

WITHAM P. J.,SÁNCHEZ E. J.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Reference8 articles.

1. Simulation and analysis of solenoidal ion sources;Alderwick;Rev. Sci. Instrum.,2008

2. A molecular-beam diffraction study of H2 adsorption on Ni(110);Engel;Surf. Sci.,1981

3. Helium-3 spin-echo: principles and application to dynamics at surfaces;Jardine;Prog. Surf. Sci.,2009

4. Imaging with neutral atoms: a new matter-wave microscope;Koch;J. Microsc.,2008

5. Testing of lateral resolution in the nanometre range using the BAM-L002: certified reference material: application to ToF-SIMS IV and NanoESCA instruments;Senoner;J. Surf. Anal.,2005

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