X-ray microanalysis of real materials using Monte Carlo simulations-Reference-Cited by-同舟云学术

X-ray microanalysis of real materials using Monte Carlo simulations

Published:2005 Issue:11 Volume:37 Page:875-886
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Gauvin Raynald

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference37 articles.

1. Application des sondes électroniques à une méthode d'analyse ponctuelle chimique et cristallographique. Thesis, University of Paris, Publication O.N.E.R.A. No. 55 (1952), 1951.

2. , , , , , , . Scanning Electron Microscopy and Microanalysis. Plenum Press: New York, 1992.

3. Quantitative Electron Microprobe Analysis of Thin Films on Substrates

4. X-Ray Microanalysis of Thin Surface Films and Coatings

5. Quantitative x-ray microanalysis of spherical inclusions embedded in a matrix using a SEM and Monte Carlo simulations

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