Quantitative x-ray microanalysis of spherical inclusions embedded in a matrix using a SEM and Monte Carlo simulations-Reference-Cited by-同舟云学术

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Quantitative x-ray microanalysis of spherical inclusions embedded in a matrix using a SEM and Monte Carlo simulations

Published:1992 Issue:1 Volume:14 Page:37-48
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Gauvin Raynald,L'Espérance Gilles,St-Laurent Sylvain

Funder

“Fonds pour la formation de chercheurs et l'aide à la recherche du Québec”

Natural Science and Engineering Research Council of Canada

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.4950140107/fullpdf

Reference24 articles.

1. X-ray fluorescence yields, Auger, and Coster-Kronig transition probabilities;Bambinek;Rev Mod Phys,1972

2. A further improvement in the Gaussian σ(ρZ) approach for matrix correction in quantitative electron probe microanalysis;Bastin;Scanning,1986

3. Quantitative electron probe microanalysis using Gaussian σ(ρZ) curves;Brown;X-Ray Spectrs,1982

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2. Inverse modeling for quantitative X-ray microanalysis applied to 2D heterogeneous materials;Ultramicroscopy;2020-12

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4. What Remains to Be Done to Allow Quantitative X-Ray Microanalysis Performed with EDS to Become a True Characterization Technique?;Microscopy and Microanalysis;2012-10

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