Inverse modeling for quantitative X-ray microanalysis applied to 2D heterogeneous materials-Reference-Cited by-同舟云学术

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Inverse modeling for quantitative X-ray microanalysis applied to 2D heterogeneous materials

Published:2020-12 Issue: Volume:219 Page:113117
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Yuan Yu,Demers Hendrix,Brodusch Nicolas,Wang Xianglong,Gauvin Raynald

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference41 articles.

1. Scanning electron microscopy and X-ray microanalysis;Goldstein,2003

2. V.D. Scott, G. Love, S.J.B. Reed, Quantitative electron-probe microanalysis, 1995.

3. Application of electron probes to local chemical and crystallographic analysis;Castaing,1951

4. Principles of thin film X-ray microanalysis;Goldstein,1979

5. Electron probe microanalysis, in: Microprobe techniques in the earth sciences;Reed,1995

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Generative Adversarial Networks and Mixture Density Networks-Based Inverse Modeling for Microstructural Materials Design;Integrating Materials and Manufacturing Innovation;2022-11-08

2. Trends in artificial intelligence, machine learning, and chemometrics applied to chemical data;Analytical Science Advances;2021-02-02

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