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High-efficiency detector of secondary and backscattered electrons for low-dose imaging in the ESEM

  • Published:2018-01 Issue: Volume:184 Page:1-11
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Neděla Vilém,Tihlaříková Eva,Runštuk Jiří,Hudec Jiří

Funder

Ministry of Education, Youth and Sports

European Commission

Czech Academy of Sciences

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference57 articles.

1. Foundation of environmental scanning electron microscopy;Danilatos,1988

2. The use of environmental scanning electron microscopy for imaging wet and insulating materials;Donald;Nat. Mater.,2003

3. Review and outline of environmental SEM at present;Danilatos;J. Microsc.,1991

4. Investigating biological ultrastructure using environmental scanning electron microscopy (ESEM);Stokes,2003

5. Controlled dehydration of a biological sample using an alternative form of environmental SEM;Neděla;J. Microsc.,2010
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