New computation methods for low-voltage effects in SEM and X-ray microanalysis
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Mechanics of Materials,General Materials Science
Reference36 articles.
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2. Elemental mapping of microstructures by scanning electron microscopy-energy dispersive X-ray spectrometry (SEM-EDS): extraordinary advances with the silicon drift detector (SDD);Newbury;J. Anal. Atomic Spectrometry,2013
3. Electron-specimen interaction in low voltage scanning electron microscopy;Bongeler;Scanning,1993
4. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis;Reimer,2000
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