A new detection system for x-ray microanalysis based on a silicon drift detector with Peltier cooling
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1148169
Reference10 articles.
1. X-ray microanalysis with Si(Li) detectors
2. A low noise FET with integrated charge restoration for radiation detectors
3. Semiconductor drift chamber — An application of a novel charge transport scheme
4. Semiconductor drift chambers for position and energy measurements
5. A high-resolution silicon drift chamber for X-ray spectroscopy
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