Quantitative Electron Microprobe Analysis of Thin Films on Substrates-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Quantitative Electron Microprobe Analysis of Thin Films on Substrates

Published:1974-07 Issue:4 Volume:18 Page:352-363
ISSN:0018-8646
Container-title:IBM Journal of Research and Development
language:
Short-container-title:IBM J. Res. & Dev.

Author:

Kyser D. F.,Murata K.

Publisher

IBM

Subject

General Computer Science

Link

http://xplorestaging.ieee.org/ielx5/5288520/5391266/05391273.pdf?arnumber=5391273

Cited by 164 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electron beams near surfaces: the concept of partial intensities for surface analysis and perspective on the low energy regime;Frontiers in Materials;2023-06-15

2. Accelerated screening of Cu–Ga–Fe oxide semiconductors by combinatorial spray deposition and high-throughput analysis;Materials Advances;2023

3. Saturation profile measurement of atomic layer deposited film by X-ray microanalysis on lateral high-aspect-ratio structure;Applied Surface Science Advances;2021-09

4. Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis;Microscopy Research and Technique;2021-08-26

5. Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering;Progress in Materials Science;2021-07

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP