Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis-Reference-Cited by-同舟云学术

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Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis

Published:2021-08-26 Issue:2 Volume:85 Page:437-446
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microscopy Res & Technique

Author:

Lima de Oblitas Raissa¹^ORCID,Teixeira Fernanda¹^ORCID,Salvadori Maria Cecília¹^ORCID

Affiliation:

1. Instituto de Física Universidade de São Paulo São Paulo Brazil

Funder

Conselho Nacional de Desenvolvimento Científico e Tecnológico

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior

Fundação de Amparo à Pesquisa do Estado de São Paulo

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jemt.23917

Reference27 articles.

1. Cathodic Arcs

2. CATHODIC ARC DEPOSITION OF FILMS

3. Castaing R.(1951). Application of electron probes to local chemical and crystallographic analysis. University of Paris. Available online (translation):https://the-mas.org/castaings-famous-1951-thesis/

4. CASINO V2.42—A Fast and Easy-to-use Modeling Tool for Scanning Electron Microscopy and Microanalysis Users

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