1. Practical Surface Analysis, Vol 1: Auger and X-ray Photoelectron Spectroscopy. Wiley: Chichester, 1990.
2. Practical Surface Analysis, Vol 2: Ion and Neutral Spectroscopies. Wiley: Chichester, 1992.
3. ISO 24 237 (in draft). Surface Chemical Analysis?Auger electron spectrometers?Repeatability of intensity scale. ISO: Geneva, 2004.
4. ISO 24 236 (in draft). Surface Chemical Analysis?X-ray photoelectron spectrometers?Repeatability of intensity scale. ISO: Geneva, 2004.
5. In Secondary Ion Mass Spectrometry, SIMS XI, (eds). Wiley: Chichester, 1998; 999.