Effective Attenuation Lengths for Different Quantitative Applications of X-ray Photoelectron Spectroscopy
Author:
Affiliation:
1. Institute of Physical Chemistry, Polish Academy of Sciences, ul. Kasprzaka 44/52, 01-224 Warsaw, Poland
2. Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8370, USA
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy,General Chemistry
Link
http://aip.scitation.org/doi/pdf/10.1063/5.0008576
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4. Surface sensitivity of X-ray photoelectron spectroscopy
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