Space Distribution of the Chemical Composition of the Thermo-Grown SiO2SiOxSi System
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. Morphology and electronic structure of Si–SiO2 interfaces and Si surfaces
2. Chemical bond and related properties of SiO2 VI. electronic structure of SiOx
3. Energy-gap variation at the Si-SiOx–SiO2 interface
4. Variation of semiconductor properties through the SiOx region of Si SiO2 interfaces
5. Si‐SiO2interface characterization from angular dependence of x‐ray photoelectron spectra
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An Interface Enhanced Spectroscopic Ellipsometry Technique: Application to Si ‐ SiO2;Journal of The Electrochemical Society;1992-05-01
2. The Thermal Growth of Very Thin SiO2 Films A Diffusion-Controlled Process;Physica Status Solidi (a);1989-07-16
3. SiSiO2 interfacial atomic scale roughness caused by inhomogeneous thermal oxidation;Physica Status Solidi (a);1989-05-16
4. On the SiSiO2 interface roughness in VLSIMOS structures;Physica Status Solidi (a);1988-10-16
5. Theoretical Study of the Gradual Chemical Transition at the SiSiO2 Interface. II. Electronic Density of States Calculations;physica status solidi (b);1986-07-01
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3