Energy-gap variation at the Si-SiOx–SiO2 interface
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference14 articles.
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1. Energy gap-determination of a carbon contaminated thermal silicon oxide thin film using reflection electron energy loss spectroscopy;Journal of Non-Crystalline Solids;1997-08
2. Thermopower, d.c. electrical conductivity and thermal resistivity of SiOx thin films;International Journal of Electronics;1992-11
3. Thermopower measurements on SiO x thin films;Journal of Materials Science;1990-10
4. Monte Carlo Simulation of Transport in Submicron Structures;The Physics of Submicron Semiconductor Devices;1988
5. Theoretical Study of the Gradual Chemical Transition at the SiSiO2 Interface. II. Electronic Density of States Calculations;physica status solidi (b);1986-07-01
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